About Wafer Inspection Services, Inc.

WIS™, Inc. manufactures it's own line of Particle detection systems.

Established in 1986, WIS™ Inc., specializes in support and maintenance of metrology equipment used for the manufacturing of silicon wafers, silicon carbide and semiconductor devices. We provide semiconductor metrology legacy support using former OEM trained engineers.

Reticle Particle Detection Systems

Reticle System Integrators

Wafer Inspection & Reticle Inspection

Semiconductor Particle Detection

Wafer Inspection Tools

JDSU Lasers & Lumentum Lasers

Metrology Equipment

Silicon Carbide

Photomask Inspection Systems

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Metrology Equipment

Metrology equipment sales, service & support
Reduce or eliminate OEM support.