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About

Established in 1986, WIS™ Inc., specializes in support and maintenance of KLA-Tencor Legacy tools.

OTHER WIS™ SERVICES AND PRODUCTS

We now manufacture our own Reticle and Wafer Inspection Systems and have intiated final testing for NEW Wafer Scanners available from WIS, Inc.

Our wafer scanners detect sub micron particles on Bare Si, as well as Scratches, Pits and other surface anomalies.

  • Reticle Particle Detection Systems
  • Reticle System Integrators
  • Wafer Inspection & Reticle Inspection
  • Semiconductor Particle Detection
  • JDSU Lasers & Lumentum Lasers
  • Metrology Equipment
  • Photomask Inspection Systems

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