14/09/2018 by Chris Norton 0 Comments
New Photomask and Wafer Inspection systems
Fortrend, Engineering has integrated our PDS 1020 – G2 Reticle inspection system into two of their Reticle stockers.
REPLACING KLA-TENCOR SURFSCAN LEGACY TOOLS
We are finalizing test results for our own newly manufactured wafer scanners.
Targeting replacement of the KLA-Tencor 6200; 6220; 6400; 6420 SP1 Classic; and potentially the SP1-TBi.
Wafer Inspection Services, Inc. is a privately held Boston area based company established in 1986.
WIS, Inc. offers world-class semiconductor metrology legacy tool support.
Specializing in on site services, parts, support and maintenance of metrology tools used in semiconductor manufacturing.
Our products include new and retubed JDSU Lasers and Lumentum Lasers
PDS-1020G2 Reticle Mask Inspection Systems
PDS 1020-G2W Wafer Inspection Tool
Particle detection systems
Photomask inspection systems
NIST Traceable PSL Calibration wafers